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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability, ISBN-13: 978-0387747460
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"Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability" explores the challenges and methodologies associated with testing and ensuring the reliability of nanomaterials and nanoscale devices. The book covers the fundamental principles of nanotechnology, focusing on the unique defects that can arise at the nanoscale and how these can impact the performance and durability of engineered systems. By addressing issues of defect tolerance and reliability, the authors aim to provide insights and strategies for researchers and engineers working in the rapidly evolving field of nanotechnology, ultimately promoting the safe and effective integration of nanomaterials into practical applications.
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Title: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
ISBN-13: 978-0387747460
Author(s): Ashutosh Tiwari, Brian J. S. Smith
Publisher: Springer
Publication Year: 2008
Pages: 400
Language: English
Description: This book addresses the testing, defect tolerance, and reliability aspects of emerging nanotechnologies. It offers insights into various methodologies and techniques useful for characterizing nanostructured materials and devices.
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"Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability" provides a comprehensive examination of the challenges and advancements in the field of nanotechnology, particularly focusing on testing methodologies, defect management, and ensuring reliability in nanoscale materials and devices. The book combines theoretical insights with practical applications, making it an essential resource for researchers, engineers, and industry professionals. By addressing critical issues related to defect tolerance and the reliability of emerging nanomaterials, it lays the groundwork for future innovations and improvements in nanotechnology applications across various sectors.
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